(Catalog No. 6130)

This apparatus is for bench testing sensitivity of nonlinear EEDs. It is very useful in determination of no-fire power levels of semiconductor-bridge (SCB) initiators.

As a nonlinear EED (SCB) changes temperature, the ratio of voltage to current (effective resistance) changes. Thus, one cannot use either a voltage-regulated power supply, or a current-regulated power supply, to test an SCB. Hence the need for this power-regulated tester.